Patents
- US patent #9,757,027 B2 - System and method for performing tear film structure measurement and evaporation rate measurements.
- US patent #9,833,139 B1 - System and method for performing tear film structure measurement
- European patent #3,113,668 B1 - System and method for performing tear film structure measurement and evaporation rate measurements.
- US patent #10,456,029 B2 - Apparatus and method for detecting surface topography
- European patent #3434173B1 - System and method for performing tear film structure measurement